
Integrating spheres measure reflectance and transmittance factors, commonly called
reflectance and transmittance. The relative spectral reflectance (transmittance) is
defined as the ratio of the flux reflected (transmitted) by the specimen to that of a
standard surface under identical geometrical and spectral conditions. For
transmittance the standard surface is air, and for reflectance the standard surface is a
secondary white standard calibrated relative to the perfectly reflecting diffuser.
Because of the geometry of the integrating sphere, it has the ability to collect most
reflected or transmitted radiation, remove any directional preferences, and present an
integrated signal to the detector.
Reflectance measurements
First, a baseline is recorded with the PTFE reference disk covering the reflectance
port. The sample is then mounted over the port and the reflection off the sample
surface is collected by the sphere. The reflectance is therefore measured relative to the
PTFE disk. This is the 'substitution' method.
The total (diffuse and specular) or the diffuse-only reflectance may be measured by
mounting the sample against the sphere port in two different configurations. The
specular component may be calculated from the difference of these two, or the Cary
Absolute Specular Reflectance Accessory (SRA P/N 00 100438 00) may be used to
give an absolute value of the specular component.
A variety of sample types and sizes may be used with the accessory, in conjunction
with different sample holders. For powders, pastes or other material requiring a
sample container, a powder cell is available for use in the DRA.
If only very small amounts of powder or paste are available, or if measurements
extending beyond the range of 250–2500 nm are required, the DRA cannot be used.
The 'Praying Mantis' accessory (P/N 00 100469 00) is used for these measurements.
Alternatively, you can use the powder cell
in conjunction with the small sample
holder.
Transmittance measurements
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